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@INPROCEEDINGS{Remez:827184,
      author       = {Remez, Roei and Tsur, Yuval and Lu, Peng-Han and Tavabi,
                      Amir H. and Dunin-Borkowski, Rafal and Arie, Ady},
      title        = {{G}eneration of super-oscillatory electron beams beyond the
                      diffraction limit},
      address      = {Weinheim, Germany},
      publisher    = {Wiley-VCH Verlag GmbH $\&$ Co. KGaA},
      reportid     = {FZJ-2017-01382},
      pages        = {731 - 732},
      year         = {2016},
      comment      = {European Microscopy Congress 2016: Proceedings},
      booktitle     = {European Microscopy Congress 2016:
                       Proceedings},
      abstract     = {In 1873, Ernst Abbe discovered that the imaging resolution
                      of conventional lenses is fundamentally limited by
                      diffraction, which, since then, has been overcome using a
                      variety of different approaches in optical microscopy. In
                      electron microscopy, thanks to remarkable developments in
                      aberration corrected electron optics, the resolution of
                      transmission electron microscopes (TEMs) and scanning TEMs
                      (STEMs) has reached the sub-Ångström regime. However, it
                      is still limited by instrumental stability, residual
                      higher-order aberrations and the diffraction limit of the
                      electron-optical system. Recently, a concept termed
                      super-oscillation, which is analogous to the idea of
                      super-directive antennas in the microwave community [1], was
                      proposed [2, 3] and applied in light optics for far field
                      imaging of sub-wavelength, barely-resolved objects beyond
                      the diffraction limit [4]. A super-oscillating function is a
                      band-limited function that is able to oscillate faster
                      locally than its highest Fourier component and thereby
                      produce an arbitrarily small spot in the far field.Here, we
                      demonstrate experimentally for the first time a
                      super-oscillatory electron beam whose characteristic probe
                      size is much smaller than the Abbe diffraction limit. Figure
                      1(a) shows scanning electron microscopy (SEM) images of a
                      conventional grating mask (left) and a super-oscillation
                      off-axis hologram (right) that have the same outer diameters
                      (10 µm). The masks were fabricated by focused ion beam
                      milling 200-nm-thick SiN membranes coated with 150 nm Au.
                      The masks were inserted into the C2 aperture plane of a
                      probe-corrected FEI Titan 80-300 (S)TEM. Owing to the probe
                      aberration corrector and relatively small numerical aperture
                      (convergence semi-angle), diffraction-limited spots could be
                      easily obtained from the conventional grating (Fig. 1,
                      left), while a super-oscillatory electron probe, which was
                      generated at the first diffraction order (Fig. 1, right),
                      produced a much smaller hot-spot in the center. The size of
                      the super oscillation hot-spot is approximately one third of
                      that of the diffraction-limited spot. It could theoretically
                      be decreased further, even below the de-Broglie wavelength
                      of the electrons, by varying the ratio between the inner and
                      outer radii.Further applications of such super-oscillatory
                      electron wave functions, e.g. enhanced STEM imaging, will be
                      presented.},
      month         = {Aug},
      date          = {2016-08-28},
      organization  = {16th European Microscopy Congress (EMC
                       2016), Lyon (France), 28 Aug 2016 - 2
                       Sep 2016},
      cin          = {PGI-5 / ER-C-1},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
      doi          = {10.1002/9783527808465.EMC2016.6221},
      url          = {https://juser.fz-juelich.de/record/827184},
}