%0 Conference Paper
%A Müller - Caspary, K.
%A Krause, F. F.
%A Béché, A.
%A Duchamp, Martial
%A Schowalter, M.
%A Löffler, S.
%A Migunov, Vadim
%A Winkler, Florian
%A Huth, Melanie
%A Ritz, R.
%A Ihle, S.
%A Simson, M.
%A Ryll, H.
%A Soltau, H.
%A Strüder, L.
%A Zweck, J.
%A Schattschneider, P.
%A Dunin-Borkowski, Rafal
%A Verbeeck, J.
%A Rosenauer, A.
%T Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
%C New York, NY
%I Cambridge University Press
%M FZJ-2017-01401
%P 484 - 485
%D 2016
%B Microscopy and Microanalysis
%C 24 Jul 2016 - 28 Jul 2016, Columbus (OH)
Y2 24 Jul 2016 - 28 Jul 2016
M2 Columbus, OH
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%U https://juser.fz-juelich.de/record/827203