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Contribution to a conference proceedings FZJ-2017-01401
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Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors

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2016
Cambridge University Press New York, NY

Microscopy and Microanalysis, ColumbusColumbus, OH, 24 Jul 2016 - 28 Jul 20162016-07-242016-07-28 New York, NY : Cambridge University Press 484 - 485 ()

Classification:
Contributing Institute(s):
  1. Mikrostrukturforschung (PGI-5)
  2. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016
Database coverage:
Medline ; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
Workflow collections > Public records
Publications database
 Record created 2017-01-31, last modified 2024-06-10
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