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@INPROCEEDINGS{MllerCaspary:827203,
      author       = {Müller - Caspary, K. and Krause, F. F. and Béché, A. and
                      Duchamp, Martial and Schowalter, M. and Löffler, S. and
                      Migunov, Vadim and Winkler, Florian and Huth, Melanie and
                      Ritz, R. and Ihle, S. and Simson, M. and Ryll, H. and
                      Soltau, H. and Strüder, L. and Zweck, J. and
                      Schattschneider, P. and Dunin-Borkowski, Rafal and Verbeeck,
                      J. and Rosenauer, A.},
      title        = {{M}easurement of atomic eletric fields by scanning
                      transmission electron microscopy ({STEM}) employing
                      ultrafast detectors},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2017-01401},
      pages        = {484 - 485},
      year         = {2016},
      month         = {Jul},
      date          = {2016-07-24},
      organization  = {Microscopy and Microanalysis, Columbus
                       (OH), 24 Jul 2016 - 28 Jul 2016},
      cin          = {PGI-5 / ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)8},
      url          = {https://juser.fz-juelich.de/record/827203},
}