Contribution to a conference proceedings

FZJ-2017-01401

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors

Müller - Caspary, K. ; Krause, F. F. ; Béché, A. ; Duchamp, M. ; Schowalter, M. ; Löffler, S. ; Migunov, V.FZJ* ; Winkler, F.FZJ* ; Huth, M. ; Ritz, R. ; Ihle, S. ; Simson, M. ; Ryll, H. ; Soltau, H. ; Strüder, L. ; Zweck, J. ; Schattschneider, P. ; Dunin-Borkowski, R.FZJ* ; Verbeeck, J. ; Rosenauer, A.

2016
Cambridge University Press New York, NY

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)
2. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016

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Database coverage:
; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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