001     827211
005     20210129225808.0
024 7 _ |2 doi
|a 10.7567/APEX.9.076701
024 7 _ |2 ISSN
|a 1882-0778
024 7 _ |2 ISSN
|a 1882-0786
024 7 _ |2 Handle
|a 2128/13749
024 7 _ |a WOS:000379310000042
|2 WOS
037 _ _ |a FZJ-2017-01409
082 _ _ |a 530
100 1 _ |0 P:(DE-HGF)0
|a Kim, Hyun-su
|b 0
|e Corresponding author
245 _ _ |a Lloyd’s mirror interference lithography with EUV radiation from a high-harmonic source
260 _ _ |a Tokyo
|b ¯Oy¯o Butsuri-Gakkai
|c 2016
336 7 _ |2 DRIVER
|a article
336 7 _ |2 DataCite
|a Output Types/Journal article
336 7 _ |0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
|a Journal Article
|b journal
|m journal
|s 1486372842_6848
336 7 _ |2 BibTeX
|a ARTICLE
336 7 _ |2 ORCID
|a JOURNAL_ARTICLE
336 7 _ |0 0
|2 EndNote
|a Journal Article
520 _ _ |a We demonstrate interference lithography using a high-harmonic source. Extreme ultraviolet (EUV) radiation is produced by high-harmonic generation with 800 nm light from a femtosecond Ti:sapphire laser (40 fs pulses, 1 kHz, 2 W average power) in argon gas. Interference patterns created using Lloyd's mirror setup and monochromatized radiation at the 27th harmonic (29 nm) are recorded using a ZEP-520A photoresist, producing features with <200 nm pitch. The effect of the use of femtosecond pulsed EUV radiation on the recorded pattern is investigated. The capability of the high-harmonic source for high-resolution patterning is discussed.
536 _ _ |0 G:(DE-HGF)POF3-521
|a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
|c POF3-521
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |0 P:(DE-HGF)0
|a Baksh, Peter
|b 1
700 1 _ |0 P:(DE-HGF)0
|a Odstrcil, Michal
|b 2
700 1 _ |0 P:(DE-HGF)0
|a Miszczak, Magdalena
|b 3
700 1 _ |0 P:(DE-HGF)0
|a Frey, Jeremy G.
|b 4
700 1 _ |0 P:(DE-Juel1)157957
|a Juschkin, Larissa
|b 5
700 1 _ |0 P:(DE-HGF)0
|a Brocklesby, William S.
|b 6
773 _ _ |0 PERI:(DE-600)2417569-9
|a 10.7567/APEX.9.076701
|g Vol. 9, no. 7, p. 076701 -
|n 7
|p 076701 -
|t Applied physics express
|v 9
|x 1882-0786
|y 2016
856 4 _ |u https://juser.fz-juelich.de/record/827211/files/Kim_2016_Appl._Phys._Express_9_076701.pdf
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/827211/files/Kim_2016_Appl._Phys._Express_9_076701.pdf?subformat=pdfa
|x pdfa
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:827211
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)166021
|a Forschungszentrum Jülich
|b 0
|k FZJ
910 1 _ |0 I:(DE-588b)36225-6
|6 P:(DE-Juel1)166021
|a RWTH Aachen
|b 0
|k RWTH
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)165774
|a Forschungszentrum Jülich
|b 2
|k FZJ
910 1 _ |0 I:(DE-588b)36225-6
|6 P:(DE-Juel1)165774
|a RWTH Aachen
|b 2
|k RWTH
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)157957
|a Forschungszentrum Jülich
|b 5
|k FZJ
910 1 _ |0 I:(DE-588b)36225-6
|6 P:(DE-Juel1)157957
|a RWTH Aachen
|b 5
|k RWTH
913 1 _ |0 G:(DE-HGF)POF3-521
|1 G:(DE-HGF)POF3-520
|2 G:(DE-HGF)POF3-500
|a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2016
915 _ _ |0 StatID:(DE-HGF)0200
|2 StatID
|a DBCoverage
|b SCOPUS
915 _ _ |0 LIC:(DE-HGF)CCBY4
|2 HGFVOC
|a Creative Commons Attribution CC BY 4.0
915 _ _ |0 StatID:(DE-HGF)0100
|2 StatID
|a JCR
|b APPL PHYS EXPRESS : 2015
915 _ _ |0 StatID:(DE-HGF)0150
|2 StatID
|a DBCoverage
|b Web of Science Core Collection
915 _ _ |0 StatID:(DE-HGF)0110
|2 StatID
|a WoS
|b Science Citation Index
915 _ _ |0 StatID:(DE-HGF)0111
|2 StatID
|a WoS
|b Science Citation Index Expanded
915 _ _ |0 StatID:(DE-HGF)9900
|2 StatID
|a IF < 5
915 _ _ |0 StatID:(DE-HGF)0510
|2 StatID
|a OpenAccess
915 _ _ |0 StatID:(DE-HGF)1150
|2 StatID
|a DBCoverage
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |0 StatID:(DE-HGF)0199
|2 StatID
|a DBCoverage
|b Thomson Reuters Master Journal List
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-9-20110106
|k PGI-9
|l Halbleiter-Nanoelektronik
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 1
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-9-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 1 _ |a FullTexts


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21