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000827312 1001_ $$0P:(DE-Juel1)131014$$aValov, Ilia$$b0
000827312 1112_ $$aMaterials Research Society Fall Meeting$$cBoston$$d2016-11-27 - 2016-12-02$$wUSA
000827312 245__ $$aEffects of Moisture and Redox Reactions in VCM and ECM Resistive Switching Memories
000827312 260__ $$c2016
000827312 3367_ $$033$$2EndNote$$aConference Paper
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000827312 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000827312 7001_ $$0P:(DE-Juel1)162283$$aLübben, Michael$$b1
000827312 7001_ $$0P:(DE-HGF)0$$aTappertzhofen, S.$$b2
000827312 7001_ $$0P:(DE-HGF)0$$aWiefels, S.$$b3
000827312 7001_ $$0P:(DE-HGF)0$$aTsuruoka, T.$$b4
000827312 7001_ $$0P:(DE-HGF)0$$aHasegawa, T.$$b5
000827312 7001_ $$0P:(DE-HGF)0$$aAono, M.$$b6
000827312 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7
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000827312 9141_ $$y2016
000827312 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000827312 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
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