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Effects of Moisture and Redox Reactions in VCM and ECM Resistive Switching Memories
Valov, I.FZJ* ; Lübben, M. ; Tappertzhofen, S. ; Wiefels, S. ; Tsuruoka, T. ; Hasegawa, T. ; Aono, M. ; Waser, R.FZJ*
2016
2016Materials Research Society Fall Meeting, BostonBoston, USA, 27 Nov 2016 - 2 Dec 20162016-11-272016-12-02
(2016)2016
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
Appears in the scientific report
2016
Database coverage:No Authors Fulltext