TY  - CONF
AU  - Valov, Ilia
AU  - Lübben, Michael
AU  - Tappertzhofen, S.
AU  - Wiefels, S.
AU  - Tsuruoka, T.
AU  - Hasegawa, T.
AU  - Aono, M.
AU  - Waser, R.
TI  - Effects of Moisture and Redox Reactions in VCM and ECM Resistive Switching Memories
M1  - FZJ-2017-01483
PY  - 2016
T2  - Materials Research Society Fall Meeting
CY  - 27 Nov 2016 - 2 Dec 2016, Boston (USA)
Y2  - 27 Nov 2016 - 2 Dec 2016
M2  - Boston, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/827312
ER  -