001     8281
005     20180208200151.0
024 7 _ |2 DOI
|a 10.1002/pssr.200903052
024 7 _ |2 WOS
|a WOS:000268708800007
037 _ _ |a PreJuSER-8281
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Molak, A.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Insulator-semiconductor-metallic state transition induced by electric fields in Mn-doped NaNbO3
260 _ _ |a Weinheim
|b Wiley-VCH
|c 2009
300 _ _ |a 127 - 129
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Physica Status Solidi - Rapid Research Letters
|x 1862-6254
|0 16681
|y 5
|v 3
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The electro-forming procedure was applied to NaNbO3: Mn and NaNbO3 insulator crystals. The electric current flow induced a transition to the metallic-type temperature dependence of the resistance. The Mn dopant shortened the time needed for the transition. The LC-AFM measurement showed a non-homogeneous distribution in local resistance resulting from the electric field via the AFM tip. We ascribe this effect to percolation in the network of the highly conducting filaments, whose formation is facilitated by the Mn ions. We conclude that the insulator-metal transition is induced within a subsystem of extended defects already existing in the NaNbO3 : Mn crystal lattice host. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA. Weinheim
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
|c P42
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK412
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Szot, K.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB2799
773 _ _ |a 10.1002/pssr.200903052
|g Vol. 3, p. 127 - 129
|p 127 - 129
|q 3<127 - 129
|0 PERI:(DE-600)2259465-6
|t Physica status solidi / Rapid research letters
|v 3
|y 2009
|x 1862-6254
856 7 _ |u http://dx.doi.org/10.1002/pssr.200903052
909 C O |o oai:juser.fz-juelich.de:8281
|p VDB
913 1 _ |k P42
|v Grundlagen für zukünftige Informationstechnologien
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|b Schlüsseltechnologien
|0 G:(DE-Juel1)FUEK412
|x 0
914 1 _ |y 2009
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |0 StatID:(DE-HGF)0020
|a No peer review
920 1 _ |d 31.12.2010
|g IFF
|k IFF-6
|l Elektronische Materialien
|0 I:(DE-Juel1)VDB786
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology
|g JARA
|x 1
970 _ _ |a VDB:(DE-Juel1)117199
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-7-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
981 _ _ |a I:(DE-Juel1)VDB881


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21