000837642 001__ 837642
000837642 005__ 20210129231411.0
000837642 037__ $$aFZJ-2017-06520
000837642 1001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b0$$eCorresponding author
000837642 1112_ $$a27th Int. Symp. on Power and Timing, Modeling, Optimization and Simulation$$cThessaloniki$$d2017-09-25 - 2017-09-27$$gPATMOS2017$$wGreece
000837642 245__ $$aOn the origin of the fading memory effect in ReRAMs
000837642 260__ $$c2017
000837642 3367_ $$033$$2EndNote$$aConference Paper
000837642 3367_ $$2DataCite$$aOther
000837642 3367_ $$2BibTeX$$aINPROCEEDINGS
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000837642 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1505398614_23761$$xOther
000837642 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
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000837642 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich$$b0$$kFZJ
000837642 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000837642 9141_ $$y2017
000837642 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000837642 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
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