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000837843 1001_ $$00000-0002-2365-861X$$aTarakina, N. V.$$b0$$eCorresponding author
000837843 245__ $$aMicrostructural characterization of Cr-doped (Bi,Sb)$_{2}$ Te$_{3}$ thin films
000837843 260__ $$aLondon$$bRSC$$c2017
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000837843 520__ $$aThe presence of twins, both tilting and twisting of domains and resulting strain at domain boundaries in magnetically doped topological insulators can significantly modify their band topology and carrier density, and hence their electronic properties. In this paper, we report on a detailed microstructural characterization of Cr-doped (Bi,Se)2Te3 layers grown by molecular beam epitaxy on Si(111). We provide detailed microscopical descriptions of defects present in the films (twins, mosaicity tilt, mosaicity twist), and suggest ways to control their structural quality.
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000837843 7001_ $$0P:(DE-HGF)0$$aSchreyeck, S.$$b1
000837843 7001_ $$0P:(DE-Juel1)145413$$aDuchamp, Martial$$b2
000837843 7001_ $$0P:(DE-HGF)0$$aKarczewski, G.$$b3
000837843 7001_ $$0P:(DE-HGF)0$$aGould, C.$$b4
000837843 7001_ $$0P:(DE-HGF)0$$aBrunner, K.$$b5
000837843 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b6
000837843 7001_ $$0P:(DE-HGF)0$$aMolenkamp, L. W.$$b7
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