Journal Article

FZJ-2017-06620

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Microstructural characterization of Cr-doped (Bi,Sb)$_{2}$ Te$_{3}$ thin films

Tarakina, N. V. (Corresponding author) ; Schreyeck, S. ; Duchamp, M. ; Karczewski, G. ; Gould, C. ; Brunner, K. ; Dunin-Borkowski, R.FZJ* ; Molenkamp, L. W.

2017
RSC London

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Please use a persistent id in citations: doi:10.1039/C7CE00872D

Abstract: The presence of twins, both tilting and twisting of domains and resulting strain at domain boundaries in magnetically doped topological insulators can significantly modify their band topology and carrier density, and hence their electronic properties. In this paper, we report on a detailed microstructural characterization of Cr-doped (Bi,Se)2Te3 layers grown by molecular beam epitaxy on Si(111). We provide detailed microscopical descriptions of defects present in the films (twins, mosaicity tilt, mosaicity twist), and suggest ways to control their structural quality.

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)
2. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017

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Database coverage:
; Allianz-Lizenz / DFG ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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