TY  - JOUR
AU  - Tarakina, N. V.
AU  - Schreyeck, S.
AU  - Duchamp, Martial
AU  - Karczewski, G.
AU  - Gould, C.
AU  - Brunner, K.
AU  - Dunin-Borkowski, Rafal
AU  - Molenkamp, L. W.
TI  - Microstructural characterization of Cr-doped (Bi,Sb)$_{2}$ Te$_{3}$ thin films
JO  - CrystEngComm
VL  - 19
IS  - 26
SN  - 1466-8033
CY  - London
PB  - RSC
M1  - FZJ-2017-06620
SP  - 3633 - 3639
PY  - 2017
AB  - The presence of twins, both tilting and twisting of domains and resulting strain at domain boundaries in magnetically doped topological insulators can significantly modify their band topology and carrier density, and hence their electronic properties. In this paper, we report on a detailed microstructural characterization of Cr-doped (Bi,Se)2Te3 layers grown by molecular beam epitaxy on Si(111). We provide detailed microscopical descriptions of defects present in the films (twins, mosaicity tilt, mosaicity twist), and suggest ways to control their structural quality.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000404882900013
DO  - DOI:10.1039/C7CE00872D
UR  - https://juser.fz-juelich.de/record/837843
ER  -