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@ARTICLE{Tarakina:837843,
      author       = {Tarakina, N. V. and Schreyeck, S. and Duchamp, Martial and
                      Karczewski, G. and Gould, C. and Brunner, K. and
                      Dunin-Borkowski, Rafal and Molenkamp, L. W.},
      title        = {{M}icrostructural characterization of {C}r-doped
                      ({B}i,{S}b)$_{2}$ {T}e$_{3}$ thin films},
      journal      = {CrystEngComm},
      volume       = {19},
      number       = {26},
      issn         = {1466-8033},
      address      = {London},
      publisher    = {RSC},
      reportid     = {FZJ-2017-06620},
      pages        = {3633 - 3639},
      year         = {2017},
      abstract     = {The presence of twins, both tilting and twisting of domains
                      and resulting strain at domain boundaries in magnetically
                      doped topological insulators can significantly modify their
                      band topology and carrier density, and hence their
                      electronic properties. In this paper, we report on a
                      detailed microstructural characterization of Cr-doped
                      (Bi,Se)2Te3 layers grown by molecular beam epitaxy on
                      Si(111). We provide detailed microscopical descriptions of
                      defects present in the films (twins, mosaicity tilt,
                      mosaicity twist), and suggest ways to control their
                      structural quality.},
      cin          = {ER-C-1 / PGI-5},
      ddc          = {540},
      cid          = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)PGI-5-20110106},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000404882900013},
      doi          = {10.1039/C7CE00872D},
      url          = {https://juser.fz-juelich.de/record/837843},
}