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@ARTICLE{Tarakina:837843,
author = {Tarakina, N. V. and Schreyeck, S. and Duchamp, Martial and
Karczewski, G. and Gould, C. and Brunner, K. and
Dunin-Borkowski, Rafal and Molenkamp, L. W.},
title = {{M}icrostructural characterization of {C}r-doped
({B}i,{S}b)$_{2}$ {T}e$_{3}$ thin films},
journal = {CrystEngComm},
volume = {19},
number = {26},
issn = {1466-8033},
address = {London},
publisher = {RSC},
reportid = {FZJ-2017-06620},
pages = {3633 - 3639},
year = {2017},
abstract = {The presence of twins, both tilting and twisting of domains
and resulting strain at domain boundaries in magnetically
doped topological insulators can significantly modify their
band topology and carrier density, and hence their
electronic properties. In this paper, we report on a
detailed microstructural characterization of Cr-doped
(Bi,Se)2Te3 layers grown by molecular beam epitaxy on
Si(111). We provide detailed microscopical descriptions of
defects present in the films (twins, mosaicity tilt,
mosaicity twist), and suggest ways to control their
structural quality.},
cin = {ER-C-1 / PGI-5},
ddc = {540},
cid = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)PGI-5-20110106},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000404882900013},
doi = {10.1039/C7CE00872D},
url = {https://juser.fz-juelich.de/record/837843},
}