%0 Conference Paper
%A Abbaspour, E.
%A Menzel, Stephan
%A Jungemann, C.
%T Random telegraph noise analysis in Redox-based Resistive Switching Devices Using KMC Simulations
%M FZJ-2017-06659
%D 2017
%B International Conference on Simulation of Semiconductor Processes and Devices
%C 7 Sep 2017 - 9 Sep 2017, Kamakura (Japan)
Y2 7 Sep 2017 - 9 Sep 2017
M2 Kamakura, Japan
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/837888