000837888 001__ 837888
000837888 005__ 20210129231440.0
000837888 037__ $$aFZJ-2017-06659
000837888 1001_ $$0P:(DE-HGF)0$$aAbbaspour, E.$$b0
000837888 1112_ $$aInternational Conference on Simulation of Semiconductor Processes and Devices$$cKamakura$$d2017-09-07 - 2017-09-09$$gSISPAD$$wJapan
000837888 245__ $$aRandom telegraph noise analysis in Redox-based Resistive Switching Devices Using KMC Simulations
000837888 260__ $$c2017
000837888 3367_ $$033$$2EndNote$$aConference Paper
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000837888 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000837888 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b1$$ufzj
000837888 7001_ $$0P:(DE-HGF)0$$aJungemann, C.$$b2
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000837888 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich$$b1$$kFZJ
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000837888 9141_ $$y2017
000837888 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
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