TY  - CONF
AU  - Abbaspour, E.
AU  - Menzel, Stephan
AU  - Jungemann, C.
TI  - Random telegraph noise analysis in Redox-based Resistive Switching Devices Using KMC Simulations
M1  - FZJ-2017-06659
PY  - 2017
T2  - International Conference on Simulation of Semiconductor Processes and Devices
CY  - 7 Sep 2017 - 9 Sep 2017, Kamakura (Japan)
Y2  - 7 Sep 2017 - 9 Sep 2017
M2  - Kamakura, Japan
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/837888
ER  -