Home > Publications database > Microstructure and electrical conductivity of (Y,Sr)CoO3-delta thin films tuned by the film-growth temperature |
Journal Article | FZJ-2017-06692 |
; ; ; ; ; ; ;
2017
Elsevier
Lausanne
This record in other databases:
Please use a persistent id in citations: doi:10.1016/j.jallcom.2017.04.192
Abstract: Epitaxial films composed of (Y,Sr)CoO3-δ and nano-scale Y2O3 columns are successfully grown on (La0.289Sr0.712)(Al0.633Ta0.356)O3(001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO2-δ planes of (Y,Sr)CoO3-δ. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y2O3 columns and the (Y,Sr)CoO3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.
![]() |
The record appears in these collections: |