%0 Journal Article
%A Barthel, Juri
%A Houben, Lothar
%A Tillmann, Karsten
%T FEI Titan G3 50-300 PICO
%J Journal of large-scale research facilities
%V A 34
%@ 2364-091X
%C Jülich
%I Forschungszentrum Jülich
%M FZJ-2017-07719
%P 1 - 57
%D 2015
%X The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.17815/jlsrf-1-57
%U https://juser.fz-juelich.de/record/840164