Journal Article

FZJ-2017-07719

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png FEI Titan G3 50-300 PICO

Barthel, J.FZJ* ; Houben, L. ; Tillmann, K.FZJ*

2015
Forschungszentrum Jülich Jülich

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Please use a persistent id in citations: http://hdl.handle.net/2128/15959  doi:10.17815/jlsrf-1-57

Abstract: The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

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