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000840164 1001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b0$$ufzj
000840164 245__ $$aFEI Titan G3 50-300 PICO
000840164 260__ $$aJülich$$bForschungszentrum Jülich$$c2015
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000840164 520__ $$aThe FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.
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000840164 773__ $$0PERI:(DE-600)2810938-7$$a10.17815/jlsrf-1-57$$p1 - 57$$tJournal of large-scale research facilities$$vA 34$$x2364-091X$$y2015
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