TY  - JOUR
AU  - Barthel, Juri
AU  - Houben, Lothar
AU  - Tillmann, Karsten
TI  - FEI Titan G3 50-300 PICO
JO  - Journal of large-scale research facilities
VL  - A 34
SN  - 2364-091X
CY  - Jülich
PB  - Forschungszentrum Jülich
M1  - FZJ-2017-07719
SP  - 1 - 57
PY  - 2015
AB  - The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.
LB  - PUB:(DE-HGF)16
DO  - DOI:10.17815/jlsrf-1-57
UR  - https://juser.fz-juelich.de/record/840164
ER  -