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@ARTICLE{Barthel:840164,
author = {Barthel, Juri and Houben, Lothar and Tillmann, Karsten},
title = {{FEI} {T}itan {G}3 50-300 {PICO}},
journal = {Journal of large-scale research facilities},
volume = {A 34},
issn = {2364-091X},
address = {Jülich},
publisher = {Forschungszentrum Jülich},
reportid = {FZJ-2017-07719},
pages = {1 - 57},
year = {2015},
abstract = {The FEI Titan G3 50-300 PICO is a unique fourth generation
transmission electron microscope which has been specifically
designed for the investigation of a wide range of solid
state phenomena taking place on the atomic scale and thus
necessitating true atomic resolution analysis capabilities.
For these purposes, the FEI Titan G3 50-300 PICO is equipped
with a Schottky type high-brightness electron gun (FEI
X-FEG), a monochromator unit, and a Cs probe corrector (CEOS
DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a
double biprism, a post-column energy filter system (Gatan
Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan
UltraScan 4000 UHS). Characterised by a TEM and STEM
resolution well below 50 pm at 200 kV, the instrument is one
of the few chromatically-corrected high resolution
transmission electron microscopes in the world. Typical
examples of use and technical specifications for the
instrument are given below.},
cin = {ER-C-2},
ddc = {620},
cid = {I:(DE-Juel1)ER-C-2-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
doi = {10.17815/jlsrf-1-57},
url = {https://juser.fz-juelich.de/record/840164},
}