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001     840164
005     20210129231749.0
024 7 _ |a 10.17815/jlsrf-1-57
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024 7 _ |a 2128/15959
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037 _ _ |a FZJ-2017-07719
041 _ _ |a English
082 _ _ |a 620
100 1 _ |a Barthel, Juri
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245 _ _ |a FEI Titan G3 50-300 PICO
260 _ _ |a Jülich
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520 _ _ |a The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.
536 _ _ |a 143 - Controlling Configuration-Based Phenomena (POF3-143)
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700 1 _ |a Houben, Lothar
|0 P:(DE-Juel1)130723
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700 1 _ |a Tillmann, Karsten
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773 _ _ |a 10.17815/jlsrf-1-57
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913 1 _ |a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
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