%0 Journal Article
%A Jin, Lei
%A Barthel, Juri
%A Jia, Chun-Lin
%A Urban, Knut
%T Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
%J Microscopy and microanalysis
%V 23
%N S1
%@ 1435-8115
%C New York, NY
%I Cambridge University Press
%M FZJ-2017-07740
%P 422 - 423
%D 2017
%X What is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1].
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1017/S1431927617002793
%U https://juser.fz-juelich.de/record/840185