Journal Article

FZJ-2017-07740

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope

Jin, L.FZJ* ; Barthel, J.FZJ* ; Jia, C.-L.FZJ* ; Urban, K.FZJ*

2017
Cambridge University Press New York, NY

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Please use a persistent id in citations: http://hdl.handle.net/2128/19353  doi:10.1017/S1431927617002793

Abstract: What is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1].

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
2. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017

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Database coverage:
; ; ; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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