000840185 001__ 840185
000840185 005__ 20210129231753.0
000840185 0247_ $$2doi$$a10.1017/S1431927617002793
000840185 0247_ $$2ISSN$$a1431-9276
000840185 0247_ $$2ISSN$$a1435-8115
000840185 0247_ $$2Handle$$a2128/19353
000840185 037__ $$aFZJ-2017-07740
000840185 082__ $$a570
000840185 1001_ $$0P:(DE-Juel1)145711$$aJin, Lei$$b0$$ufzj
000840185 245__ $$aAtomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
000840185 260__ $$aNew York, NY$$bCambridge University Press$$c2017
000840185 3367_ $$2DRIVER$$aarticle
000840185 3367_ $$2DataCite$$aOutput Types/Journal article
000840185 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1531742932_26642
000840185 3367_ $$2BibTeX$$aARTICLE
000840185 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000840185 3367_ $$00$$2EndNote$$aJournal Article
000840185 520__ $$aWhat is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1].
000840185 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000840185 588__ $$aDataset connected to CrossRef
000840185 7001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b1$$ufzj
000840185 7001_ $$0P:(DE-Juel1)130736$$aJia, Chun-Lin$$b2$$ufzj
000840185 7001_ $$0P:(DE-Juel1)131013$$aUrban, Knut$$b3$$ufzj
000840185 773__ $$0PERI:(DE-600)1481716-0$$a10.1017/S1431927617002793$$gVol. 23, no. S1, p. 422 - 423$$nS1$$p422 - 423$$tMicroscopy and microanalysis$$v23$$x1435-8115$$y2017
000840185 8564_ $$uhttps://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.pdf$$yPublished on 2017-08-04. Available in OpenAccess from 2018-08-04.
000840185 8564_ $$uhttps://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.gif?subformat=icon$$xicon$$yPublished on 2017-08-04. Available in OpenAccess from 2018-08-04.
000840185 8564_ $$uhttps://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-1440$$xicon-1440$$yPublished on 2017-08-04. Available in OpenAccess from 2018-08-04.
000840185 8564_ $$uhttps://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-180$$xicon-180$$yPublished on 2017-08-04. Available in OpenAccess from 2018-08-04.
000840185 8564_ $$uhttps://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-640$$xicon-640$$yPublished on 2017-08-04. Available in OpenAccess from 2018-08-04.
000840185 909CO $$ooai:juser.fz-juelich.de:840185$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000840185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145711$$aForschungszentrum Jülich$$b0$$kFZJ
000840185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130525$$aForschungszentrum Jülich$$b1$$kFZJ
000840185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130736$$aForschungszentrum Jülich$$b2$$kFZJ
000840185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131013$$aForschungszentrum Jülich$$b3$$kFZJ
000840185 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000840185 9141_ $$y2017
000840185 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000840185 915__ $$0StatID:(DE-HGF)1030$$2StatID$$aDBCoverage$$bCurrent Contents - Life Sciences
000840185 915__ $$0StatID:(DE-HGF)0530$$2StatID$$aEmbargoed OpenAccess
000840185 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bMICROSC MICROANAL : 2015
000840185 915__ $$0StatID:(DE-HGF)0520$$2StatID$$aAllianz-OA
000840185 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000840185 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000840185 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000840185 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000840185 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000840185 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000840185 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000840185 915__ $$0StatID:(DE-HGF)1050$$2StatID$$aDBCoverage$$bBIOSIS Previews
000840185 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000840185 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000840185 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000840185 920__ $$lyes
000840185 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x0
000840185 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x1
000840185 980__ $$ajournal
000840185 980__ $$aVDB
000840185 980__ $$aUNRESTRICTED
000840185 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000840185 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000840185 9801_ $$aFullTexts