TY  - JOUR
AU  - Jin, Lei
AU  - Barthel, Juri
AU  - Jia, Chun-Lin
AU  - Urban, Knut
TI  - Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
JO  - Microscopy and microanalysis
VL  - 23
IS  - S1
SN  - 1435-8115
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2017-07740
SP  - 422 - 423
PY  - 2017
AB  - What is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1].
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1017/S1431927617002793
UR  - https://juser.fz-juelich.de/record/840185
ER  -