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@ARTICLE{Jin:840185,
author = {Jin, Lei and Barthel, Juri and Jia, Chun-Lin and Urban,
Knut},
title = {{A}tomic {R}esolution {I}maging of {YA}l{O}3:{C}e in the
{C}hromatic and {S}pherical {A}berration {C}orrected {PICO}
{T}ransmission {E}lectron {M}icroscope},
journal = {Microscopy and microanalysis},
volume = {23},
number = {S1},
issn = {1435-8115},
address = {New York, NY},
publisher = {Cambridge University Press},
reportid = {FZJ-2017-07740},
pages = {422 - 423},
year = {2017},
abstract = {What is the real resolution that can be realized in
practical electron microscope operation? We have
investigatedthis problem for TEM imaging in a systematic
study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a
FEI Titan G3 50-300 (PICO) electron microscope equipped with
the new CEOS CCOR+corrector for spherical (CS) and chromatic
aberration (CC) we studied the conditions to resolve the57
pm Y-Y-atom pair distance in projection along [010]. Our
successful imaging of this pair proves arecord resolution
for direct 200 kV TEM imaging [1].},
cin = {ER-C-2 / ER-C-1},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-2-20170209 / I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
doi = {10.1017/S1431927617002793},
url = {https://juser.fz-juelich.de/record/840185},
}