Home > Publications database > Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope > print |
001 | 840185 | ||
005 | 20210129231753.0 | ||
024 | 7 | _ | |a 10.1017/S1431927617002793 |2 doi |
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024 | 7 | _ | |a 1435-8115 |2 ISSN |
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100 | 1 | _ | |a Jin, Lei |0 P:(DE-Juel1)145711 |b 0 |u fzj |
245 | _ | _ | |a Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope |
260 | _ | _ | |a New York, NY |c 2017 |b Cambridge University Press |
336 | 7 | _ | |a article |2 DRIVER |
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520 | _ | _ | |a What is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1]. |
536 | _ | _ | |a 143 - Controlling Configuration-Based Phenomena (POF3-143) |0 G:(DE-HGF)POF3-143 |c POF3-143 |f POF III |x 0 |
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700 | 1 | _ | |a Barthel, Juri |0 P:(DE-Juel1)130525 |b 1 |u fzj |
700 | 1 | _ | |a Jia, Chun-Lin |0 P:(DE-Juel1)130736 |b 2 |u fzj |
700 | 1 | _ | |a Urban, Knut |0 P:(DE-Juel1)131013 |b 3 |u fzj |
773 | _ | _ | |a 10.1017/S1431927617002793 |g Vol. 23, no. S1, p. 422 - 423 |0 PERI:(DE-600)1481716-0 |n S1 |p 422 - 423 |t Microscopy and microanalysis |v 23 |y 2017 |x 1435-8115 |
856 | 4 | _ | |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04. |u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.pdf |
856 | 4 | _ | |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04. |x icon |u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.gif?subformat=icon |
856 | 4 | _ | |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04. |x icon-1440 |u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-1440 |
856 | 4 | _ | |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04. |x icon-180 |u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-180 |
856 | 4 | _ | |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04. |x icon-640 |u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.jpg?subformat=icon-640 |
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