001     840185
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024 7 _ |a 2128/19353
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037 _ _ |a FZJ-2017-07740
082 _ _ |a 570
100 1 _ |a Jin, Lei
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245 _ _ |a Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
260 _ _ |a New York, NY
|c 2017
|b Cambridge University Press
336 7 _ |a article
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520 _ _ |a What is the real resolution that can be realized in practical electron microscope operation? We have investigatedthis problem for TEM imaging in a systematic study on Ce-doped yttrium orthoaluminate,YAlO3. Employing a FEI Titan G3 50-300 (PICO) electron microscope equipped with the new CEOS CCOR+corrector for spherical (CS) and chromatic aberration (CC) we studied the conditions to resolve the57 pm Y-Y-atom pair distance in projection along [010]. Our successful imaging of this pair proves arecord resolution for direct 200 kV TEM imaging [1].
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700 1 _ |a Barthel, Juri
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700 1 _ |a Jia, Chun-Lin
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700 1 _ |a Urban, Knut
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773 _ _ |a 10.1017/S1431927617002793
|g Vol. 23, no. S1, p. 422 - 423
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|t Microscopy and microanalysis
|v 23
|y 2017
|x 1435-8115
856 4 _ |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04.
|u https://juser.fz-juelich.de/record/840185/files/div-class-title-atomic-resolution-imaging-of-yalo-span-class-sub-3-span-ce-in-the-chromatic-and-spherical-aberration-corrected-pico-transmission-electron-microscope-div.pdf
856 4 _ |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04.
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856 4 _ |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04.
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856 4 _ |y Published on 2017-08-04. Available in OpenAccess from 2018-08-04.
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