TY  - JOUR
AU  - Lüpke, Felix
AU  - Cuma, David
AU  - Korte, Stefan
AU  - Cherepanov, Vasily
AU  - Voigtländer, Bert
TI  - Four-point probe measurements using current probes with voltage feedback to measure electric potentials
JO  - Journal of physics / Condensed matter
VL  - 30
IS  - 5
SN  - 1361-648X
CY  - Bristol
PB  - IOP Publ.
M1  - FZJ-2018-00279
SP  - 054004-1 - 054004-7
PY  - 2018
AB  - We present a four-point probe resistance measurement technique which uses four equivalent current measuring units, resulting in minimal hardware requirements and corresponding sources of noise. Local sample potentials are measured by a software feedback loop which adjusts the corresponding tip voltage such that no current flows to the sample. The resulting tip voltage is then equivalent to the sample potential at the tip position. We implement this measurement method into a multi-tip scanning tunneling microscope setup such that potentials can also be measured in tunneling contact, allowing in principle truly non-invasive four-probe measurements. The resulting measurement capabilities are demonstrated for $ \newcommand{\BiTe}{{\rm BiSbTe_3}} \BiTe$ and $ \newcommand{\Si}{{\rm Si(1\,1\,1)-(7\times7)}} \Si$ samples.
LB  - PUB:(DE-HGF)16
C6  - pmid:29260731
UR  - <Go to ISI:>//WOS:000419799000001
DO  - DOI:10.1088/1361-648X/aaa31e
UR  - https://juser.fz-juelich.de/record/841995
ER  -