Journal Article

FZJ-2018-00279

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Four-point probe measurements using current probes with voltage feedback to measure electric potentials

Lüpke, F.FZJ* ; Cuma, D. ; Korte, S.FZJ* ; Cherepanov, V.FZJ* ; Voigtländer, B. (Corresponding author)FZJ*

2018
IOP Publ. Bristol

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Please use a persistent id in citations: http://hdl.handle.net/2128/22986  doi:10.1088/1361-648X/aaa31e

Abstract: We present a four-point probe resistance measurement technique which uses four equivalent current measuring units, resulting in minimal hardware requirements and corresponding sources of noise. Local sample potentials are measured by a software feedback loop which adjusts the corresponding tip voltage such that no current flows to the sample. The resulting tip voltage is then equivalent to the sample potential at the tip position. We implement this measurement method into a multi-tip scanning tunneling microscope setup such that potentials can also be measured in tunneling contact, allowing in principle truly non-invasive four-probe measurements. The resulting measurement capabilities are demonstrated for $ \newcommand{\BiTe}{{\rm BiSbTe_3}} \BiTe$ and $ \newcommand{\Si}{{\rm Si(1\,1\,1)-(7\times7)}} \Si$ samples.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2018

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Database coverage:
; ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; National-Konsortium ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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