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@ARTICLE{Lpke:841995,
author = {Lüpke, Felix and Cuma, David and Korte, Stefan and
Cherepanov, Vasily and Voigtländer, Bert},
title = {{F}our-point probe measurements using current probes with
voltage feedback to measure electric potentials},
journal = {Journal of physics / Condensed matter},
volume = {30},
number = {5},
issn = {1361-648X},
address = {Bristol},
publisher = {IOP Publ.},
reportid = {FZJ-2018-00279},
pages = {054004-1 - 054004-7},
year = {2018},
abstract = {We present a four-point probe resistance measurement
technique which uses four equivalent current measuring
units, resulting in minimal hardware requirements and
corresponding sources of noise. Local sample potentials are
measured by a software feedback loop which adjusts the
corresponding tip voltage such that no current flows to the
sample. The resulting tip voltage is then equivalent to the
sample potential at the tip position. We implement this
measurement method into a multi-tip scanning tunneling
microscope setup such that potentials can also be measured
in tunneling contact, allowing in principle truly
non-invasive four-probe measurements. The resulting
measurement capabilities are demonstrated for $
\newcommand{\BiTe}{{\rm BiSbTe_3}} \BiTe$ and $
\newcommand{\Si}{{\rm Si(1\,1\,1)-(7\times7)}} \Si$
samples.},
cin = {PGI-3 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-3-20110106 / $I:(DE-82)080009_20140620$},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:29260731},
UT = {WOS:000419799000001},
doi = {10.1088/1361-648X/aaa31e},
url = {https://juser.fz-juelich.de/record/841995},
}