001     841995
005     20210129232136.0
024 7 _ |a 10.1088/1361-648X/aaa31e
|2 doi
024 7 _ |a 0953-8984
|2 ISSN
024 7 _ |a 1361-648X
|2 ISSN
024 7 _ |a pmid:29260731
|2 pmid
024 7 _ |a WOS:000419799000001
|2 WOS
024 7 _ |a altmetric:25084119
|2 altmetric
024 7 _ |a 2128/22986
|2 Handle
037 _ _ |a FZJ-2018-00279
082 _ _ |a 530
100 1 _ |a Lüpke, Felix
|0 P:(DE-Juel1)162163
|b 0
245 _ _ |a Four-point probe measurements using current probes with voltage feedback to measure electric potentials
260 _ _ |a Bristol
|c 2018
|b IOP Publ.
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1515571720_18133
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
520 _ _ |a We present a four-point probe resistance measurement technique which uses four equivalent current measuring units, resulting in minimal hardware requirements and corresponding sources of noise. Local sample potentials are measured by a software feedback loop which adjusts the corresponding tip voltage such that no current flows to the sample. The resulting tip voltage is then equivalent to the sample potential at the tip position. We implement this measurement method into a multi-tip scanning tunneling microscope setup such that potentials can also be measured in tunneling contact, allowing in principle truly non-invasive four-probe measurements. The resulting measurement capabilities are demonstrated for $ \newcommand{\BiTe}{{\rm BiSbTe_3}} \BiTe$ and $ \newcommand{\Si}{{\rm Si(1\,1\,1)-(7\times7)}} \Si$ samples.
536 _ _ |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|0 G:(DE-HGF)POF3-141
|c POF3-141
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |a Cuma, David
|0 0000-0001-9000-9487
|b 1
700 1 _ |a Korte, Stefan
|0 P:(DE-Juel1)138943
|b 2
700 1 _ |a Cherepanov, Vasily
|0 P:(DE-Juel1)128762
|b 3
700 1 _ |a Voigtländer, Bert
|0 P:(DE-Juel1)128794
|b 4
|e Corresponding author
770 _ _ |a Special Issue on Multi-Probe Techniques
773 _ _ |a 10.1088/1361-648X/aaa31e
|g Vol. 30, no. 5, p. 054004 -
|0 PERI:(DE-600)1472968-4
|n 5
|p 054004-1 - 054004-7
|t Journal of physics / Condensed matter
|v 30
|y 2018
|x 1361-648X
856 4 _ |u https://juser.fz-juelich.de/record/841995/files/L%C3%BCpke_2018_J._Phys.__Condens._Matter_30_054004.pdf
|y Restricted
856 4 _ |x pdfa
|u https://juser.fz-juelich.de/record/841995/files/L%C3%BCpke_2018_J._Phys.__Condens._Matter_30_054004.pdf?subformat=pdfa
|y Restricted
856 4 _ |y OpenAccess
|u https://juser.fz-juelich.de/record/841995/files/1709.02383.pdf
856 4 _ |y OpenAccess
|x pdfa
|u https://juser.fz-juelich.de/record/841995/files/1709.02383.pdf?subformat=pdfa
909 C O |o oai:juser.fz-juelich.de:841995
|p openaire
|p open_access
|p VDB
|p driver
|p dnbdelivery
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)162163
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 2
|6 P:(DE-Juel1)138943
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 3
|6 P:(DE-Juel1)128762
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 4
|6 P:(DE-Juel1)128794
913 1 _ |a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-140
|0 G:(DE-HGF)POF3-141
|2 G:(DE-HGF)POF3-100
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
|b Energie
914 1 _ |y 2018
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
|b J PHYS-CONDENS MAT : 2015
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
915 _ _ |a WoS
|0 StatID:(DE-HGF)0110
|2 StatID
|b Science Citation Index
915 _ _ |a WoS
|0 StatID:(DE-HGF)0111
|2 StatID
|b Science Citation Index Expanded
915 _ _ |a IF < 5
|0 StatID:(DE-HGF)9900
|2 StatID
915 _ _ |a OpenAccess
|0 StatID:(DE-HGF)0510
|2 StatID
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1150
|2 StatID
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0310
|2 StatID
|b NCBI Molecular Biology Database
915 _ _ |a National-Konsortium
|0 StatID:(DE-HGF)0430
|2 StatID
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0300
|2 StatID
|b Medline
915 _ _ |a Nationallizenz
|0 StatID:(DE-HGF)0420
|2 StatID
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Thomson Reuters Master Journal List
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-3-20110106
|k PGI-3
|l Funktionale Nanostrukturen an Oberflächen
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 1
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 1 _ |a FullTexts


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