Hauptseite > Publikationsdatenbank > Four-point probe measurements using current probes with voltage feedback to measure electric potentials > print |
001 | 841995 | ||
005 | 20210129232136.0 | ||
024 | 7 | _ | |a 10.1088/1361-648X/aaa31e |2 doi |
024 | 7 | _ | |a 0953-8984 |2 ISSN |
024 | 7 | _ | |a 1361-648X |2 ISSN |
024 | 7 | _ | |a pmid:29260731 |2 pmid |
024 | 7 | _ | |a WOS:000419799000001 |2 WOS |
024 | 7 | _ | |a altmetric:25084119 |2 altmetric |
024 | 7 | _ | |a 2128/22986 |2 Handle |
037 | _ | _ | |a FZJ-2018-00279 |
082 | _ | _ | |a 530 |
100 | 1 | _ | |a Lüpke, Felix |0 P:(DE-Juel1)162163 |b 0 |
245 | _ | _ | |a Four-point probe measurements using current probes with voltage feedback to measure electric potentials |
260 | _ | _ | |a Bristol |c 2018 |b IOP Publ. |
336 | 7 | _ | |a article |2 DRIVER |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1515571720_18133 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
520 | _ | _ | |a We present a four-point probe resistance measurement technique which uses four equivalent current measuring units, resulting in minimal hardware requirements and corresponding sources of noise. Local sample potentials are measured by a software feedback loop which adjusts the corresponding tip voltage such that no current flows to the sample. The resulting tip voltage is then equivalent to the sample potential at the tip position. We implement this measurement method into a multi-tip scanning tunneling microscope setup such that potentials can also be measured in tunneling contact, allowing in principle truly non-invasive four-probe measurements. The resulting measurement capabilities are demonstrated for $ \newcommand{\BiTe}{{\rm BiSbTe_3}} \BiTe$ and $ \newcommand{\Si}{{\rm Si(1\,1\,1)-(7\times7)}} \Si$ samples. |
536 | _ | _ | |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141) |0 G:(DE-HGF)POF3-141 |c POF3-141 |f POF III |x 0 |
588 | _ | _ | |a Dataset connected to CrossRef |
700 | 1 | _ | |a Cuma, David |0 0000-0001-9000-9487 |b 1 |
700 | 1 | _ | |a Korte, Stefan |0 P:(DE-Juel1)138943 |b 2 |
700 | 1 | _ | |a Cherepanov, Vasily |0 P:(DE-Juel1)128762 |b 3 |
700 | 1 | _ | |a Voigtländer, Bert |0 P:(DE-Juel1)128794 |b 4 |e Corresponding author |
770 | _ | _ | |a Special Issue on Multi-Probe Techniques |
773 | _ | _ | |a 10.1088/1361-648X/aaa31e |g Vol. 30, no. 5, p. 054004 - |0 PERI:(DE-600)1472968-4 |n 5 |p 054004-1 - 054004-7 |t Journal of physics / Condensed matter |v 30 |y 2018 |x 1361-648X |
856 | 4 | _ | |u https://juser.fz-juelich.de/record/841995/files/L%C3%BCpke_2018_J._Phys.__Condens._Matter_30_054004.pdf |y Restricted |
856 | 4 | _ | |x pdfa |u https://juser.fz-juelich.de/record/841995/files/L%C3%BCpke_2018_J._Phys.__Condens._Matter_30_054004.pdf?subformat=pdfa |y Restricted |
856 | 4 | _ | |y OpenAccess |u https://juser.fz-juelich.de/record/841995/files/1709.02383.pdf |
856 | 4 | _ | |y OpenAccess |x pdfa |u https://juser.fz-juelich.de/record/841995/files/1709.02383.pdf?subformat=pdfa |
909 | C | O | |o oai:juser.fz-juelich.de:841995 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)162163 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 2 |6 P:(DE-Juel1)138943 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 3 |6 P:(DE-Juel1)128762 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)128794 |
913 | 1 | _ | |a DE-HGF |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-140 |0 G:(DE-HGF)POF3-141 |2 G:(DE-HGF)POF3-100 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |b Energie |
914 | 1 | _ | |y 2018 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b J PHYS-CONDENS MAT : 2015 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
915 | _ | _ | |a IF < 5 |0 StatID:(DE-HGF)9900 |2 StatID |
915 | _ | _ | |a OpenAccess |0 StatID:(DE-HGF)0510 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1150 |2 StatID |b Current Contents - Physical, Chemical and Earth Sciences |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0310 |2 StatID |b NCBI Molecular Biology Database |
915 | _ | _ | |a National-Konsortium |0 StatID:(DE-HGF)0430 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
915 | _ | _ | |a Nationallizenz |0 StatID:(DE-HGF)0420 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
920 | _ | _ | |l yes |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-3-20110106 |k PGI-3 |l Funktionale Nanostrukturen an Oberflächen |x 0 |
920 | 1 | _ | |0 I:(DE-82)080009_20140620 |k JARA-FIT |l JARA-FIT |x 1 |
980 | _ | _ | |a journal |
980 | _ | _ | |a VDB |
980 | _ | _ | |a UNRESTRICTED |
980 | _ | _ | |a I:(DE-Juel1)PGI-3-20110106 |
980 | _ | _ | |a I:(DE-82)080009_20140620 |
980 | 1 | _ | |a FullTexts |
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