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Impact of defect distribution on resistive switching characteristics of Sr2tiO4 thin Films

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2010
Wiley-VCH Weinheim

Advanced materials 22, () [10.1002/adma.200901493]

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Keyword(s): Oxides: chemistry (MeSH) ; Strontium: chemistry (MeSH) ; Titanium: chemistry (MeSH) ; Oxides ; Strontium ; Titanium ; J


Note: We thank P. Meuffels, C.-L. Jia, T Menke, and R. Muenstermann for helpful discussions. One of the authors (K.S.) gratefully acknowledges the Alexander von Humboldt Stiftung (AvH) for awarding him a research fellowship. Supporting Information is available online from Wiley InterScience or from the authors.

Contributing Institute(s):
  1. Elektronische Materialien (IFF-6)
  2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
  3. Mikrostrukturforschung (IFF-8)
Research Program(s):
  1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2010
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 Record created 2012-11-13, last modified 2024-06-10



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