Master Thesis

FZJ-2018-00877

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Analysis of ferroelectric layers of doped HfO2

Zhang, J. (Corresponding author)RWTH*FZJ*

2017

Note: Masterarbeit, RWTH Aachen University, 2017

---

Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2017

---