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@ARTICLE{Schnedler:848150,
author = {Schnedler, M. and Portz, V. and Semmler, U. and Moors, M.
and Waser, R. and Dunin-Borkowski, R. E. and Ebert, Ph.},
title = {{R}esistive switching in optoelectronic {III}-{V} materials
based on deep traps},
journal = {Scientific reports},
volume = {8},
number = {1},
issn = {2045-2322},
address = {London},
publisher = {Nature Publishing Group},
reportid = {FZJ-2018-03422},
pages = {9483},
year = {2018},
abstract = {Resistive switching random access memories (ReRAM) are
promising candidates for energy efficient, fast, and
non-volatile universal memories that unite the advantages of
RAM and hard drives. Unfortunately, the current ReRAM
materials are incompatible with optical interconnects and
wires. Optical signal transmission is, however, inevitable
for next generation memories in order to overcome the
capacity-bandwidth trade-off. Thus, we present here a
proof-of-concept of a new type of resistive switching
realized in III-V semiconductors, which meet all
requirements for the implementation of optoelectronic
circuits. This resistive switching effect is based on
controlling the spatial positions of vacancy-induced deep
traps by stimulated migration, opening and closing a
conduction channel through a semi-insulating compensated
surface layer. The mechanism is widely applicable to
opto-electronically usable III-V compound semiconductors.},
cin = {PGI-5 / PGI-7 / ER-C-1},
ddc = {000},
cid = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)PGI-7-20110106 /
I:(DE-Juel1)ER-C-1-20170209},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:29930354},
UT = {WOS:000435790500062},
doi = {10.1038/s41598-018-27835-x},
url = {https://juser.fz-juelich.de/record/848150},
}