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@ARTICLE{Ngelein:848185,
author = {Nägelein, Andreas and Steidl, Matthias and Korte, Stefan
and Voigtländer, Bert and Prost, Werner and Kleinschmidt,
Peter and Hannappel, Thomas},
title = {{I}nvestigation of charge carrier depletion in freestanding
nanowires by a multi-probe scanning tunneling microscope},
journal = {Nano research},
volume = {11},
number = {11},
issn = {1998-0000},
address = {[S.l.]},
publisher = {Tsinghua Press},
reportid = {FZJ-2018-03451},
pages = {5924-5934},
year = {2018},
abstract = {Profiling of the electrical properties of nanowires (NWs)
and NW heterocontacts with high spatial resolution is a
challenge for any application and advancedNW device
development. For appropriate NW analysis, we have
established afour-point prober, which is combined in vacuo
with a state-of-the-art vaporliquid-solid preparation,
enabling contamination-free NW characterization withhigh
spatial resolution. With this ultrahigh-vacuum-based
multi-tip scanningtunneling microscopy (MT-STM), we obtained
the resistance and dopingprofiles of freestanding NWs, along
with surface-sensitive information. Ourin-system 4-probe STM
approach decreased the detection limit for low
dopantconcentrations to the depleted case in upright
standing NWs, while increasingthe spatial resolution and
considering radial depletion regions, which mayoriginate
from surface changes. Accordingly, the surface potential of
oxide-freeGaAs NW {112} facets has been estimated to be
lower than 20 mV, indicating aNW surface with very low
surface state density.},
cin = {PGI-3},
ddc = {540},
cid = {I:(DE-Juel1)PGI-3-20110106},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000449842500014},
doi = {10.1007/s12274-018-2105-x},
url = {https://juser.fz-juelich.de/record/848185},
}