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@INPROCEEDINGS{Stange:849679,
author = {Stange, D. and von den Driesch, N. and Rainko, D. and
Zabel, T. and Marzban, B. and Ikonic, Z. and Zaumseil, P.
and Capellini, G. and Manti, S. and Witzens, J. and Sigg, H.
and Grutzmacher, D. and Buca, D.},
title = {{Q}uantum confinement effects in {G}e{S}n/{S}i{G}e{S}n
heterostructure lasers},
publisher = {IEEE},
reportid = {FZJ-2018-03815},
pages = {24.2.1-24.2.4},
year = {2017},
abstract = {The development of a light source on Si, which can be
integrated in photonic circuits together with CMOS
electronics, is an outstanding goal in the field of Silicon
photonics. This could e.g. help to overcome bandwidth
limitations and losses of copper interconnects as the number
of high-speed transistors on a chip increases. Here, we
discuss direct bandgap group IV materials, GeSn/SiGeSn
heterostructures and resulting quantum confinement effects
for laser implementation. After material characterization,
optical properties, including lasing, are probed via
photoluminescence spectrometry. The quantum confinement
effect in GeSn wells of different thicknesses is
investigated. Theoretical calculations show strong quantum
confinement to be undesirable past a certain level, as the
very different effective masses of r and L electrons lead to
a decrease of the L-to Γ-valley energy difference. A main
limiting factor for lasing devices turns out to be the
defective region at the interface to the Ge substrate due to
the high lattice mismatch to GeSn. The use of buffer
technology and subsequent pseudomorphic growth of
multi-quantum-wells structures offers confinement of
carriers in the active material, far from the misfit
dislocations region. Performance is strongly boosted, as a
reduction of lasing thresholds from 300 kW/cm2 for bulk
devices to below 45 kW/cm2 in multi-quantum-well lasers is
observed at low temperatures, with the reduction in
threshold far outpacing the reduction in active gain
material volume.},
month = {Dec},
date = {2017-12-02},
organization = {2017 IEEE International Electron
Devices Meeting (IEDM), San Francisco
(CA), 2 Dec 2017 - 6 Dec 2017},
cin = {PGI-9 / JARA-FIT},
cid = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)8},
doi = {10.1109/IEDM.2017.8268451},
url = {https://juser.fz-juelich.de/record/849679},
}