000851525 001__ 851525
000851525 005__ 20240610121340.0
000851525 0247_ $$2doi$$a10.1016/j.elspec.2019.07.002
000851525 0247_ $$2ISSN$$a0368-2048
000851525 0247_ $$2ISSN$$a1873-2526
000851525 0247_ $$2Handle$$a2128/25091
000851525 0247_ $$2WOS$$aWOS:000540723700015
000851525 037__ $$aFZJ-2018-05151
000851525 041__ $$aEnglish
000851525 082__ $$a620
000851525 1001_ $$0P:(DE-Juel1)165965$$aZheng, Fengshan$$b0$$eCorresponding author$$ufzj
000851525 245__ $$aMeasurement of charge density in nanoscale materials using off-axis electron holography
000851525 260__ $$aNew York, NY [u.a.]$$bElsevier$$c2020
000851525 3367_ $$2DRIVER$$aarticle
000851525 3367_ $$2DataCite$$aOutput Types/Journal article
000851525 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1602056591_12986
000851525 3367_ $$2BibTeX$$aARTICLE
000851525 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000851525 3367_ $$00$$2EndNote$$aJournal Article
000851525 520__ $$aThree approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.
000851525 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000851525 536__ $$0G:(EU-Grant)766970$$aQ-SORT - QUANTUM SORTER (766970)$$c766970$$fH2020-FETOPEN-1-2016-2017$$x1
000851525 536__ $$0G:(GEPRIS)167917811$$aDFG project 167917811 - SFB 917: Resistiv schaltende Chalkogenide für zukünftige Elektronikanwendungen: Struktur, Kinetik und Bauelementskalierung "Nanoswitches" (167917811)$$c167917811$$x2
000851525 536__ $$0G:(EU-Grant)823717$$aESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717)$$c823717$$fH2020-INFRAIA-2018-1$$x3
000851525 588__ $$aDataset connected to CrossRef
000851525 7001_ $$0P:(DE-Juel1)157760$$aCaron, Jan$$b1$$ufzj
000851525 7001_ $$0P:(DE-Juel1)159136$$aMigunov, Vadim$$b2
000851525 7001_ $$0P:(DE-HGF)0$$aBeleggia, Marco$$b3
000851525 7001_ $$0P:(DE-HGF)0$$aPozzi, Giulio$$b4
000851525 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal E.$$b5$$ufzj
000851525 773__ $$0PERI:(DE-600)1491139-5$$a10.1016/j.elspec.2019.07.002$$gp. S0368204818302032$$p146881$$tJournal of electron spectroscopy and related phenomena$$v241$$x0368-2048$$y2020
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.pdf
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/1-s2.0-S0368204818302032-main.pdf$$yOpenAccess
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.gif?subformat=icon$$xicon
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.jpg?subformat=icon-1440$$xicon-1440
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.jpg?subformat=icon-180$$xicon-180
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.jpg?subformat=icon-640$$xicon-640
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/Simdalee2-SpecialIssue-NewInvoice-FZJ.pdf?subformat=pdfa$$xpdfa
000851525 8564_ $$uhttps://juser.fz-juelich.de/record/851525/files/1-s2.0-S0368204818302032-main.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000851525 8767_ $$890118945$$92018-08-27$$d2018-08-29$$eHybrid-OA$$jZahlung erfolgt
000851525 8767_ $$890118945$$92018-08-27$$d2018-08-29$$ePublication charges$$jZahlung erfolgt
000851525 909CO $$ooai:juser.fz-juelich.de:851525$$pdnbdelivery$$popenCost$$pec_fundedresources$$pVDB$$pdriver$$pOpenAPC$$popen_access$$popenaire
000851525 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)165965$$aForschungszentrum Jülich$$b0$$kFZJ
000851525 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)157760$$aForschungszentrum Jülich$$b1$$kFZJ
000851525 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)159136$$aForschungszentrum Jülich$$b2$$kFZJ
000851525 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich$$b4$$kFZJ
000851525 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich$$b5$$kFZJ
000851525 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000851525 9141_ $$y2020
000851525 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000851525 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search
000851525 915__ $$0LIC:(DE-HGF)CCBYNCND4$$2HGFVOC$$aCreative Commons Attribution-NonCommercial-NoDerivs CC BY-NC-ND 4.0
000851525 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ ELECTRON SPECTROSC : 2015
000851525 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000851525 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000851525 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000851525 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000851525 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000851525 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC
000851525 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000851525 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000851525 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000851525 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000851525 920__ $$lyes
000851525 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000851525 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x1
000851525 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x2
000851525 9801_ $$aAPC
000851525 9801_ $$aFullTexts
000851525 980__ $$ajournal
000851525 980__ $$aVDB
000851525 980__ $$aI:(DE-Juel1)PGI-5-20110106
000851525 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000851525 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000851525 980__ $$aAPC
000851525 980__ $$aUNRESTRICTED
000851525 981__ $$aI:(DE-Juel1)ER-C-1-20170209