Journal Article

FZJ-2018-05151

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Measurement of charge density in nanoscale materials using off-axis electron holography

Zheng, F. (Corresponding author)FZJ* ; Caron, J.FZJ* ; Migunov, V.FZJ* ; Beleggia, M. ; Pozzi, G.FZJ* ; Dunin-Borkowski, R. E.FZJ*

2020
Elsevier New York, NY [u.a.]

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Please use a persistent id in citations: http://hdl.handle.net/2128/25091  doi:10.1016/j.elspec.2019.07.002

Abstract: Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)
2. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
3. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
2. Q-SORT - QUANTUM SORTER (766970) (766970)
3. DFG project 167917811 - SFB 917: Resistiv schaltende Chalkogenide für zukünftige Elektronikanwendungen: Struktur, Kinetik und Bauelementskalierung "Nanoswitches" (167917811) (167917811)
4. ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717) (823717)

Appears in the scientific report 2020

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Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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