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@ARTICLE{Zheng:851525,
      author       = {Zheng, Fengshan and Caron, Jan and Migunov, Vadim and
                      Beleggia, Marco and Pozzi, Giulio and Dunin-Borkowski, Rafal
                      E.},
      title        = {{M}easurement of charge density in nanoscale materials
                      using off-axis electron holography},
      journal      = {Journal of electron spectroscopy and related phenomena},
      volume       = {241},
      issn         = {0368-2048},
      address      = {New York, NY [u.a.]},
      publisher    = {Elsevier},
      reportid     = {FZJ-2018-05151},
      pages        = {146881},
      year         = {2020},
      abstract     = {Three approaches for the measurement of charge density
                      distributions in nanoscale materials from electron optical
                      phase images recorded using off-axis electron holography are
                      illustrated through the study of an electrically biased
                      needle-shaped sample. We highlight the advantages of using a
                      model-based iterative algorithm, which allows a priori
                      information, such as the shape of the object and the
                      influence of charges that are located outside the field of
                      view, to be taken into account. The recovered charge density
                      can be used to infer the electric field and electrostatic
                      potential.},
      cin          = {PGI-5 / ER-C-2 / ER-C-1},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-2-20170209 /
                      I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)
                      / Q-SORT - QUANTUM SORTER (766970) / DFG project 167917811 -
                      SFB 917: Resistiv schaltende Chalkogenide für zukünftige
                      Elektronikanwendungen: Struktur, Kinetik und
                      Bauelementskalierung "Nanoswitches" (167917811) / ESTEEM3 -
                      Enabling Science and Technology through European Electron
                      Microscopy (823717)},
      pid          = {G:(DE-HGF)POF3-143 / G:(EU-Grant)766970 /
                      G:(GEPRIS)167917811 / G:(EU-Grant)823717},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000540723700015},
      doi          = {10.1016/j.elspec.2019.07.002},
      url          = {https://juser.fz-juelich.de/record/851525},
}