%0 Journal Article
%A Kvashnina, Kristina O.
%A Kowalski, Piotr M.
%A Butorin, Sergei M.
%A Leinders, Gregory
%A Pakarinen, Janne
%A Bès, René
%A Li, Haijian
%A Verwerft, Marc
%T Trends in the valence band electronic structures of mixed uranium oxides
%J Chemical communications
%V 54
%N 70
%@ 1364-548X
%C Cambridge
%I Soc.
%M FZJ-2018-05536
%P 9757 - 9760
%D 2018
%X The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:30109321
%U <Go to ISI:>//WOS:000442872000010
%R 10.1039/C8CC05464A
%U https://juser.fz-juelich.de/record/852663