Journal Article FZJ-2018-05536

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Trends in the valence band electronic structures of mixed uranium oxides

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2018
Soc. Cambridge

Chemical communications 54(70), 9757 - 9760 () [10.1039/C8CC05464A]

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Abstract: The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Classification:

Contributing Institute(s):
  1. Nukleare Entsorgung und Reaktorsicherheit (IEK-6)
  2. JARA - HPC (JARA-HPC)
Research Program(s):
  1. 161 - Nuclear Waste Management (POF3-161) (POF3-161)
  2. Investigation of the new materials for safe management of high level nuclear waste. (jara0038_20121101) (jara0038_20121101)

Appears in the scientific report 2018
Database coverage:
Medline ; Allianz-Lizenz / DFG ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF >= 5 ; JCR ; NCBI Molecular Biology Database ; NationallizenzNationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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Document types > Articles > Journal Article
JARA > JARA > JARA-JARA\-HPC
Institute Collections > IFN > IFN-2
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IEK > IEK-6
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 Record created 2018-09-28, last modified 2024-07-12


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