TY  - JOUR
AU  - Kvashnina, Kristina O.
AU  - Kowalski, Piotr M.
AU  - Butorin, Sergei M.
AU  - Leinders, Gregory
AU  - Pakarinen, Janne
AU  - Bès, René
AU  - Li, Haijian
AU  - Verwerft, Marc
TI  - Trends in the valence band electronic structures of mixed uranium oxides
JO  - Chemical communications
VL  - 54
IS  - 70
SN  - 1364-548X
CY  - Cambridge
PB  - Soc.
M1  - FZJ-2018-05536
SP  - 9757 - 9760
PY  - 2018
AB  - The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.
LB  - PUB:(DE-HGF)16
C6  - pmid:30109321
UR  - <Go to ISI:>//WOS:000442872000010
DO  - DOI:10.1039/C8CC05464A
UR  - https://juser.fz-juelich.de/record/852663
ER  -