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@ARTICLE{MllerCaspary:852910,
author = {Müller-Caspary, Knut and Duchamp, Martial and Rösner,
Malte and Migunov, Vadim and Winkler, Florian and Yang, Hao
and Huth, Martin and Ritz, Robert and Simson, Martin and
Ihle, Sebastian and Soltau, Heike and Wehling, Tim and
Dunin-Borkowski, Rafal and Van Aert, Sandra and Rosenauer,
Andreas},
title = {{A}tomic-scale quantification of charge densities in
two-dimensional materials},
journal = {Physical review / B},
volume = {98},
number = {12},
issn = {2469-9950},
address = {Woodbury, NY},
publisher = {Inst.},
reportid = {FZJ-2018-05697},
pages = {121408},
year = {2018},
abstract = {The charge density is among the most fundamental solid
state properties determining bonding, electrical
characteristics, and adsorption or catalysis at surfaces.
While atomic-scale charge densities have as yet been
retrieved by solid state theory, we demonstrate both charge
density and electric field mapping across a mono-/bilayer
boundary in 2D MoS2 by momentum-resolved scanning
transmission electron microscopy. Based on consistency of
the four-dimensional experimental data, statistical
parameter estimation and dynamical electron scattering
simulations using strain-relaxed supercells, we are able to
identify an AA-type bilayer stacking and charge depletion at
the Mo-terminated layer edge.},
cin = {ER-C-1 / PGI-5},
ddc = {530},
cid = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)PGI-5-20110106},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000445508200004},
doi = {10.1103/PhysRevB.98.121408},
url = {https://juser.fz-juelich.de/record/852910},
}