Journal Article

FZJ-2018-05697

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Atomic-scale quantification of charge densities in two-dimensional materials

Müller-Caspary, K. (Corresponding author)FZJ* ; Duchamp, M. ; Rösner, M. ; Migunov, V.FZJ* ; Winkler, F.FZJ* ; Yang, H. ; Huth, M. ; Ritz, R. ; Simson, M. ; Ihle, S. ; Soltau, H. ; Wehling, T. ; Dunin-Borkowski, R.FZJ* ; Van Aert, S. ; Rosenauer, A.

2018
Inst. Woodbury, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/19751  doi:10.1103/PhysRevB.98.121408

Abstract: The charge density is among the most fundamental solid state properties determining bonding, electrical characteristics, and adsorption or catalysis at surfaces. While atomic-scale charge densities have as yet been retrieved by solid state theory, we demonstrate both charge density and electric field mapping across a mono-/bilayer boundary in 2D MoS2 by momentum-resolved scanning transmission electron microscopy. Based on consistency of the four-dimensional experimental data, statistical parameter estimation and dynamical electron scattering simulations using strain-relaxed supercells, we are able to identify an AA-type bilayer stacking and charge depletion at the Mo-terminated layer edge.

---

Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)
2. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2018

---

Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---