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000857993 1001_ $$0P:(DE-HGF)0$$aBarannik, Alexander A.$$b0
000857993 245__ $$aMillimeter-Wave WGM Resonator-Based Characterization of Continuous and Noncontinuous Ultrathin Cu Films
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000857993 520__ $$aWe analyze the experimental data on the evolution of the microwave (MW) response of the whispering gallery mode (WGM) resonator. The focus is on the thickness df variation of the conducting endplates (CEPs) from df exceeding skin layer thickness δs to dfłlδ s down to df = 0, i.e., with no CEPs. The analysis was performed by comparing the numerical simulation results obtained using COMSOL software with the authors' experimental data on the response of the Ka-band sapphire WGM resonator. The nonmonotonic change in the WGM resonator response with decreasing thickness df is explained using the metal-insulator percolation model proposed by Krupka et al. We use a different resonator (quasi-optical) technique and different mode polarization, namely, the HE14 1 δ mode. The artificially introduced discontinuity of the ultrathin film, resulting in a sharp growth of the Q-factor is analogous with the percolation material structure. The revealed effect may be useful for the development of MW devices with dynamically controlled properties of metamaterials.
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000857993 7001_ $$00000-0001-5214-5015$$aCherpak, Nickolay T.$$b1
000857993 7001_ $$0P:(DE-HGF)0$$aProtsenko, Irina A.$$b2
000857993 7001_ $$0P:(DE-Juel1)128738$$aVitusevich, Svetlana A.$$b3$$eCorresponding author
000857993 773__ $$0PERI:(DE-600)2025906-2$$a10.1109/LMWC.2019.2902952$$gp. 1 - 3$$n5$$p363-365$$tIEEE microwave and wireless components letters$$v29$$x1051-8207$$y2019
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