Journal Article FZJ-2018-06940

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Millimeter-Wave WGM Resonator-Based Characterization of Continuous and Noncontinuous Ultrathin Cu Films

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2019
IEEE New York, NY

IEEE microwave and wireless components letters 29(5), 363-365 () [10.1109/LMWC.2019.2902952]

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Abstract: We analyze the experimental data on the evolution of the microwave (MW) response of the whispering gallery mode (WGM) resonator. The focus is on the thickness df variation of the conducting endplates (CEPs) from df exceeding skin layer thickness δs to dfłlδ s down to df = 0, i.e., with no CEPs. The analysis was performed by comparing the numerical simulation results obtained using COMSOL software with the authors' experimental data on the response of the Ka-band sapphire WGM resonator. The nonmonotonic change in the WGM resonator response with decreasing thickness df is explained using the metal-insulator percolation model proposed by Krupka et al. We use a different resonator (quasi-optical) technique and different mode polarization, namely, the HE14 1 δ mode. The artificially introduced discontinuity of the ultrathin film, resulting in a sharp growth of the Q-factor is analogous with the percolation material structure. The revealed effect may be useful for the development of MW devices with dynamically controlled properties of metamaterials.

Classification:

Contributing Institute(s):
  1. Bioelektronik (ICS-8)
Research Program(s):
  1. 523 - Controlling Configuration-Based Phenomena (POF3-523) (POF3-523)

Appears in the scientific report 2019
Database coverage:
Medline ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection
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 Record created 2018-11-30, last modified 2024-06-19


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